Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz
Author:
Affiliation:
1. National Institute of Standards and Technology (NIST),Boulder,CO,80305
2. Teledyne Scientific Company,Thousand Oaks,CA,91360
3. Colorado School of Mines,Golden,CO,80401
Funder
National Institute of Standards and Technology
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10310176/10310665/10310853.pdf?arnumber=10310853
Reference15 articles.
1. Transmission line capacitance measurement
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3. G-band (140-220 GHz) and W-band (75-110 GHz) InP DHBT medium power amplifiers
4. NIST Microwave Uncertainty Framework;williams;National Institute of Standards and Technology,2017
5. Influence of Microwave Probes on Calibrated On-Wafer Measurements
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1. On-Wafer Capacitor Characterization Including Uncertainty Estimates Up to 1.0 THz;IEEE Transactions on Terahertz Science and Technology;2024-09
2. A 0.1 GHz to 1.1 THz Inverted Grounded-CPW mTRL Calibration Kit Characterization in an InP HBT Process;2024 IEEE Wireless and Microwave Technology Conference (WAMICON);2024-04-15
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