Author:
Wu Cheng-Hung,Wang Yi-Da,Lee Kuen-Jong
Cited by
2 articles.
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1. Diagnostic Test Point Insertion and Test Compaction;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-02
2. Testing and Fault-Localization Solutions for Monolithic 3D ICs;2021 IEEE International Test Conference in Asia (ITC-Asia);2021-08-18