Investigation of the bipolar degradation of SiC MOSFET body diodes and the influence of current density-Reference-Cited by-同舟云学术

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Investigation of the bipolar degradation of SiC MOSFET body diodes and the influence of current density

Published:2021-03 Issue: Volume: Page:
ISSN:
Container-title:2021 IEEE International Reliability Physics Symposium (IRPS)
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Author:

Palanisamy S.,Basler T.,Lutz J.,Kunzel C.,Wehrhahn-Kilian L.,Elpelt R.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9405068/9405088/09405183.pdf?arnumber=9405183

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