Author:
Kuhrmann Marco,Tell Paolo,Hebig Regina,Klunder Jil Ann-Christin,Munch Jurgen,Linssen Oliver,Pfahl Dietmar,Felderer Michael,Prause Christian,Macdonell Steve,Nakatumba-Nabende Joyce,Raffo David,Beecham Sarah,Tuzun Eray,Lopez Gustavo,Paez Nicolas,Fontdevila Diego,Licorish Sherlock,Kupper Steffen,Ruhe Guenther,Knauss Eric,Ozcan-Top Ozden,Clarke Paul,Mc Caffery Fergal Hugh,Genero Marcela,Vizcaino Aurora,Piattini Mario,Kalinowski Marcos,Conte Tayana,Prikladnicki Rafael,Krusche Stephan,Coskuncay Ahmet,Scott Ezequiel,Calefato Fabio,Pimonova Svetlana,Pfeiffer Rolf-Helge,Pagh Schultz Ulrik,Heldal Rogardt,Fazal-Baqaie Masud,Anslow Craig,Nayebi Maleknaz,Schneider Kurt,Sauer Stefan,Winkler Dietmar,Biffl Stefan,Bastarrica Cecilia,Richardson Ita
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Cited by
32 articles.
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