Modeling Changes in Measured Conductance of Thin Boron Carbide Semiconducting Films Under Irradiation
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Published:2016-12
Issue:6
Volume:63
Page:2815-2822
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ISSN:0018-9499
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Container-title:IEEE Transactions on Nuclear Science
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language:
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Short-container-title:IEEE Trans. Nucl. Sci.
Author:
Peterson George G.,Wang Yongqiang,Ianno N. J.,Nastasi Michael
Funder
Nebraska Nanoscale Facility: National Nanotechnology Coordinated Infrastructure and the Nebraska Center for Materials and Nanoscience
National Science Foundation
Nebraska Research Initiative
Center for Integrated Nanotechnologies, a DOE Nanoscience user facility jointly operated by Los Alamos and Sandia National laboratories
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
1 articles.
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