Monte Carlo Evaluation of Single Event Effects in a Deep-Submicron Bulk Technology: Comparison Between Atmospheric and Accelerator Environment-Reference-Cited by-同舟云学术

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Monte Carlo Evaluation of Single Event Effects in a Deep-Submicron Bulk Technology: Comparison Between Atmospheric and Accelerator Environment

Published:2017-01 Issue:1 Volume:64 Page:596-604
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Infantino Angelo,Alia Ruben Garcia,Brugger Markus

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx7/23/7869239/07676310.pdf?arnumber=7676310

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The potential of the ILC beam dump for high-intensity and large-area irradiation field with atmospheric-like neutrons and muons;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2023-05

2. Soft errors in semiconductor devices due to environmental radiation;Journal of the Atomic Energy Society of Japan;2023

3. Design of 30 V High-Voltage Low-Power Radiation-Tolerant Analog Switch IC;IEEE Transactions on Nuclear Science;2022-04

4. New Capabilities of the FLUKA Multi-Purpose Code;Frontiers in Physics;2022-01-27

5. Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization With Neutrons and Alpha Particles;IEEE Transactions on Nuclear Science;2021-07

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