Improvement of Clamped Inductive Turn-Off Ruggedness of Trench IGBT at Overcurrent Condition with Optimized Split Gate Structure-Reference-Cited by-同舟云学术

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Improvement of Clamped Inductive Turn-Off Ruggedness of Trench IGBT at Overcurrent Condition with Optimized Split Gate Structure

Published:2019-11 Issue: Volume: Page:
ISSN:
Container-title:2019 16th China International Forum on Solid State Lighting & 2019 International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS)
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Author:

Lu Jiang,Liu Jiawei,Tian Xiaoli,Chen Hong,Liang Fei,Bai Yun

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9005308/9019749/09019803.pdf?arnumber=9019803

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1. Multi-modal Medical Image Fusion Based on GAN and the Shift-Invariant Shearlet Transform;2020 IEEE International Conference on Bioinformatics and Biomedicine (BIBM);2020-12-16

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