Introduction to measurements for power transistor characterization-Reference-Cited by-同舟云学术

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Introduction to measurements for power transistor characterization

Published:2008-06 Issue:3 Volume:9 Page:70-85
ISSN:1527-3342
Container-title:IEEE Microwave Magazine
language:
Short-container-title:IEEE Microwave

Author:

De Groote Fabien,Teyssier Jean-Pierre,Gasseling Tony,Jardel Olivier,Verspecht Jan

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx5/6668/4519456/04519497.pdf?arnumber=4519497

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