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Design Criteria and Error Sensitivity of Time-Domain Channel Characterization (TCC) for Asymmetry Fixture De-Embedding

  • Published:2015-08 Issue:4 Volume:57 Page:836-846
  • ISSN:0018-9375
  • Container-title:IEEE Transactions on Electromagnetic Compatibility
  • language:
  • Short-container-title:IEEE Trans. Electromagn. Compat.

Author:

Yoon Changwook,Tsiklauri Mikheil,Zvonkin Mikhail,Chen Qinghua Bill,Razmadze Alexander,Aflaki Aman,Kim Jingook,Fan Jun,Drewniak James L.

Funder

National Science Foundation

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics

Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. S-parameter Extrapolation for Improving Near-f max Accuracy in 2x-thru Calibration;IEEE Transactions on Electromagnetic Compatibility;2024-08

2. Electromagnetic Coupling Estimation Based on Hybrid Equivalent Dipoles and Field-Circuit Models;IEEE Transactions on Electromagnetic Compatibility;2024

3. A 2x-Thru Standard De-embedding Method of Surface Components in High-Speed PCBs;2022 IEEE USNC-URSI Radio Science Meeting (Joint with AP-S Symposium);2022-07-10

4. A Hybrid De-Embedding Method for Low Loss and Reciprocal PCB Fixtures;IEEE Transactions on Instrumentation and Measurement;2022

5. A Deembedding Method for the S-Parameter Extraction of Surface-Mounted Devices With Asymmetric Fixtures;IEEE Microwave and Wireless Components Letters;2021-02
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