A New Methodology to Build the Internal Activity Block of ICEM-CE for Complex Integrated Circuits

Author:

Ghfiri ChaimaeORCID,Boyer AlexandreORCID,Durier Andre,Ben Dhia Sonia

Funder

Institut de Recherche Technologique Saint-Exupéry Robustesse Electronique

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Electronic Board Emission Model and its Application for Microcontroller Emission;2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa);2024-05-20

2. Stochastic modeling of microcontroller emission;2023 IEEE 32nd Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS);2023-10-15

3. Impact of Supply Voltage and Operating Point in IC PDN Modeling;2023 International Symposium on Electromagnetic Compatibility – EMC Europe;2023-09-04

4. Accelerated ageing effects on the EMC performance of LDO regulators under multi-stresses: Experimental study and prediction approach;Microelectronics Reliability;2023-08

5. Validation of IC Conducted Emission and Immunity Models Including Aging and Thermal Stress;IEEE Transactions on Electromagnetic Compatibility;2023-06

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