Achieving OPD super-resolution of the fiber-optic white light interferometer

Author:

Chengcheng Hou1,Guangjin Zheng1,Yao Zhao1,Zhengying Han1,Xiangliang Zheng1,Fuzhou Shang1,Zihan Wang1,Yesheng Gao1

Affiliation:

1. The 41st Institute of China Electronics Technology Group Corporation,Qingdao,China

Publisher

IEEE

Reference6 articles.

1. Analysis of white light interferograms using wavelet methods;jurgen;J Optics Communications,1998

2. Quasi-distributed birefringence dispersion measurement for polarization maintain device with high accuracy based on white light interferometry

3. An algorithm for profilometry by white-light phase-shifting interferometry;yorozu;Journnal of modern optic,2009

4. Thin-film thickness profile and its refractive index measurements by dispersive white-light interferometry;youngsik;J OPTICS EXPRESS,2006

5. Measuring the beatlength of polarizaiton maintaining fiber by broadband light source and conoscopic interference;jian;Journal of optoelectronics laser,2006

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