Slice-Based Cognitive Complexity Metrics for Defect Prediction
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Publisher
IEEE
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http://xplorestaging.ieee.org/ielx7/9040394/9054788/09054836.pdf?arnumber=9054836
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. The Effectiveness of Hidden Dependence Metrics in Bug Prediction;IEEE Access;2024
2. Predicting Bugs by Monitoring Developers During Task Execution;2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE);2023-05
3. Cognitive Complexity Reduction through Control Flow Graph Generation;2022 IEEE 7th International conference for Convergence in Technology (I2CT);2022-04-07
4. Clone detection through srcClone: A program slicing based approach;Journal of Systems and Software;2022-02
5. Compiler IR-Based Program Encoding Method for Software Defect Prediction;Computers, Materials & Continua;2022
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