CrackNex: a Few-shot Low-light Crack Segmentation Model Based on Retinex Theory for UAV Inspections-Reference-Cited by-同舟云学术

CrackNex: a Few-shot Low-light Crack Segmentation Model Based on Retinex Theory for UAV Inspections

Published:2024-05-13 Issue: Volume:3 Page:11155-11162
ISSN:
Container-title:2024 IEEE International Conference on Robotics and Automation (ICRA)
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Author:

Yao Zhen¹,Xu Jiawei¹,Hou Shuhang¹,Chuah Mooi Choo¹

Affiliation:

1. Lehigh University,P.C. Rossin College of Engineering and Applied Science,Department of Computer Science and Engineering,Bethlehem,PA,USA,18015

Funder

National Science Foundation

Publisher

IEEE

Link

Reference59 articles.

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