Statistical process control: what you don't measure can hurt you!-Reference-Cited by-同舟云学术

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Statistical process control: what you don't measure can hurt you!

Published:2003-03 Issue:2 Volume:20 Page:49-51
ISSN:0740-7459
Container-title:IEEE Software
language:en
Short-container-title:IEEE Softw.

Author:

Eickelmann N.,Anant A.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Software

Link

http://xplorestaging.ieee.org/ielx5/52/26575/01184166.pdf?arnumber=1184166

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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3. Critical success factors for implementing statistical process control in the software industry;Benchmarking: An International Journal;2012-05-25

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