Fabrication and Testing of Single Photon Avalanche Detectors in the TSMC 0.18μm CMOS Technology-Reference-Cited by-同舟云学术

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Fabrication and Testing of Single Photon Avalanche Detectors in the TSMC 0.18μm CMOS Technology

Published:2007-03 Issue: Volume: Page:
ISSN:
Container-title:2007 41st Annual Conference on Information Sciences and Systems
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Author:

Marwick M.A.,Andreou A.G.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/4298256/4298257/04298405.pdf?arnumber=4298405

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Trade-Offs in Sensor Systems Design: A Tutorial;IEEE Sensors Journal;2022-06-01

2. High-Speed, Single-Photon Avalanche-Photodiode Imager for Biomedical Applications;IEEE Sensors Journal;2011-10

3. A flexible compact readout circuit for SPAD arrays;Detectors and Imaging Devices: Infrared, Focal Plane, Single Photon;2010-08-19

4. Single photon avalanche photodetector with integrated quenching fabricated in TSMC 0.18 [micro sign]m 1.8 V CMOS process;Electronics Letters;2008

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