Heavy Ion and Proton Induced SEUs in Very Deep Sub-Micron Technologies-Reference-Cited by-同舟云学术

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Heavy Ion and Proton Induced SEUs in Very Deep Sub-Micron Technologies

Published:2022-10-03 Issue: Volume: Page:1-7
ISSN:
Container-title:2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS)
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Author:

Tanios Bendy¹,Cárdenas Gabriel Durán¹,Lüdeke Sascha²,Javanainen Arto²,Poivey Christian³

Affiliation:

1. ALTER Technology TüV Nord France,Ramonville-Saint-Agne,France,31520

2. University of Jyväskylä,Accelerator Laboratory,Department of Physics, P.O. Box 35,Jyväskylä,Finland,FI-40014

3. European Space Research and Technology Centre (ESTEC), European Space Agency (ESA),Noordwijk,The Netherlands,2201 AZ

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10412245/10412349/10412401.pdf?arnumber=10412401

Reference12 articles.

1. Assessment of the direct ionization contribution to the proton SEU rate;Guillermin

2. Worst-Case Proton Contribution to the Direct Ionization SEU Rate

3. Assessment of Proton Direct Ionization for the Radiation Hardness Assurance of Deep Submicron SRAMs Used in Space Applications

4. The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate

5. Hardness Assurance for Proton Direct Ionization-Induced SEEs Using a High-Energy Proton Beam

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