Determination of local crystal quality characteristics and of the orientation of CdTe semiconductor films by nonlinear optical methods-Reference-Cited by-同舟云学术

Determination of local crystal quality characteristics and of the orientation of CdTe semiconductor films by nonlinear optical methods

Published:1995-02-28 Issue:2 Volume:25 Page:183-186
ISSN:1063-7818
Container-title:Quantum Electronics
language:
Short-container-title:Quantum Electron.

Author:

Balanyuk V V,Krasnov V F,Musher S L,Prots V I,Ryabchenko V E,Stoyanov S A,Struts S G,Stupak M F,Syskin V S

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Statistical and Nonlinear Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/1063-7818/25/i=2/a=A27/pdf

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