Features of multilayer mirror application for focusing and collimating X-rays from inverse Compton scattering sources

Author:

Barysheva M.M.,Malyshev I.V.,Polkovnikov V.N.,Salashchenko N.N.,Svechnikov M.V.,Chkhalo N.I.

Abstract

Abstract We have analysed the use of X-ray interference multilayer mirrors as the elements of a focusing scheme for a compact source based on inverse Compton scattering. An algorithm is proposed for selecting mirror parameters, which takes into account the properties of the radiation source. The dependence of wavelength on the viewing angle and the energy line broadening for a fixed viewing angle are found to be the main limitations in the use of multilayer mirrors. Efficient radiation collection calls for the application of broadband mirrors. It is shown that the efficiency of multilayer mirrors in a Kirkpatrick – Baez X-ray focusing setup exceeds that of total external reflection mirrors by an order of magnitude, and that stack multilayer mirrors offer a small advantage over the periodic ones. The overall efficiency of source radiation collection in the photon energy range ΔE = 10 – 12 keV amounts to 12 % for the two-mirror Kirkpatrick – Baez setup. For a spectral region with a bandwidth ΔE/E = 3 %, the efficiency ranges up to 69 %.

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Statistical and Nonlinear Physics,Electronic, Optical and Magnetic Materials

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Multistrip multilayer mirrors for sources based on inverse Compton scattering;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2024-07

2. Calculation of the Reflection Coefficient of Multilayer X-Ray Mirrors for Sources Based on Inverse Compton Scattering;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2023-12

3. Study on full-aperture intensity response measurement for x-ray Kirkpatrick–Baez microscope;Optical Engineering;2023-05-31

4. The concept of a stigmatic flat-field X-ray spectrograph based on conical diffraction;Quantum Electronics;2022-05-01

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