Imaging diffraction VLS spectrometer for a wavelength range λ > 120 Å-Reference-Cited by-同舟云学术

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Imaging diffraction VLS spectrometer for a wavelength range λ > 120 Å

Published:2017-01-30 Issue:1 Volume:47 Page:54-57
ISSN:1063-7818
Container-title:Quantum Electronics
language:
Short-container-title:Quantum Electron.

Author:

Vishnyakov E A,Kolesnikov A O,Kuzin A A,Negrov D V,Ragozin E N,Sasorov P V,Shatokhin A N

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Statistical and Nonlinear Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/1063-7818/47/i=1/a=54/pdf

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2. High-Resolution Imaging Spectrograph for the Ultrasoft X-ray Range;Bulletin of the Lebedev Physics Institute;2023-07

3. Single-wavelength tunable erbium-doped fiber laser based on electron beam lithography inscribed varied-period plane diffraction grating;Optics & Laser Technology;2021-08

4. Soft X-ray spectrometers based on aperiodic reflection gratings and their application;Physics-Uspekhi;2021-08-01

5. Modification and Polishing of the Holographic Diffraction Grating Grooves by a Neutralized Ar Ion Beam;Technical Physics;2020-11

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