Visualisation of structural inhomogeneities in strongly scattering media using the method of spatially-resolved reflectometry: Monte Carlo simulation-Reference-Cited by-同舟云学术

Visualisation of structural inhomogeneities in strongly scattering media using the method of spatially-resolved reflectometry: Monte Carlo simulation

Published:2011-06-30 Issue:6 Volume:41 Page:557-563
ISSN:1063-7818
Container-title:Quantum Electronics
language:
Short-container-title:Quantum Electron.

Author:

Bykov A V,Priezzhev A V,Myllylä Risto A

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Statistical and Nonlinear Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/1063-7818/41/i=6/a=A14/pdf

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