Sampling phased array a new technique for signal processing and ultrasonic imaging

Author:

Bernus L von1,Bulavinov A2,Dalichow M3,Joneit D4,Krning M5,Reddy K M6

Affiliation:

1. Dr Ludwig von Bernus is General Manager of Q NET Engineering GmbH, Saarbrcken, Germany and a senior scientist at Fraunhofer Institute for Nondestructive Testing IZFP. Dr von Bernus is an expert in the design and development of UT- and ET- NDT systems.

2. Dr Andrey Bulavinov is a senior scientist at Fraunhofer-IZFP. He works in the field of quantitative non-destructive testing with a special emphasis on advanced UT systems.

3. Michael Dalichow, President of Quality Network Inc (QNET), in Sparta, NJ, USA, is a qualified Level III NDT engineer contributing to the process of NDT through designing advanced UT and ET inspection systems required by NDT customers.

4. Dr Dieter Joneit is a senior scientist at Fraunhofer-IZFP. He is an expert for NDT hardware development based on modern microelectronics.

5. Prof Dr hc mult Michael Krning is head of chair for quality assurance and non-destructive testing at Saarland University and director of Fraunhofer Institute for Nondestructive Testing in Saarbrcken, Germany.

6. Krishna Mohan Reddy is the Promoter and Director of Quality Network Pvt Ltd and Lucid Software Ltd, Chennai, India. He has an interest in NDT research areas specifically in imaging, visualisation and developing a common software platform for multiple NDT techniques in process integrated testing systems.

Publisher

British Institute of Non-Destructive Testing (BINDT)

Subject

Materials Chemistry,Metals and Alloys,Mechanical Engineering,Mechanics of Materials

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