Permeability Measurements of Thin Film Using a Flexible Microstrip Line-Type Probe Up To 40 GHz
Author:
Affiliation:
1. Tohoku Gakuin University
2. Sendai National College of Technology
3. Toei Scientific Industrial Company Ltd.
4. Candox Systems Inc.
5. Graduate School of Engineering, Tohoku University
Publisher
The Magnetics Society of Japan
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials
Link
https://www.jstage.jst.go.jp/article/msjmag/41/2/41_1701R002/_pdf
Reference11 articles.
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2. 2) M. Yamaguchi, S. Yabukami and K.I. Arai: IEEE Trans. Magn., 32, 4941 (1996).
3. 3) H. B. Weir: Proc IEEE., 62, 33 (1975).
4. 4) T. Kimura, S. Yabukami, T. Ozawa, Y. Miyazawa, H. Kenju, Y. Shimada: J. Magn. Soc. Jpn. 38, pp. 87-91 (2014).
5. 5) K. Kusunoki, S. Yabukami, T. Ozawa, H. Uetake, H. Yamada, Y. Miyazawa, Y. Shimada: J. Magn. Soc. Jpn. 39, pp. 111-115 (2015).
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