Dependence of Thin-Film Media Properties on the Composition of a Very Thin Cr-Based Seedlayer: Relation between Growth Form, Melting Point, Affinity for Oxygen of a Cr-Based Seedlayer, and Media Microstructure.-Reference-Cited by-同舟云学术

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Dependence of Thin-Film Media Properties on the Composition of a Very Thin Cr-Based Seedlayer: Relation between Growth Form, Melting Point, Affinity for Oxygen of a Cr-Based Seedlayer, and Media Microstructure.

Published:2003 Issue:4 Volume:27 Page:234-240
ISSN:0285-0192
Container-title:Journal of the Magnetics Society of Japan
language:
Short-container-title:J. Magn. Soc. Jpn.

Author:

Yoshimura S.,Djayaprawira D. D.,Mikami M.,Takakuwa Y.,Takahashi M.

Publisher

The Magnetics Society of Japan

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials

Reference13 articles.

1. The ultra clean sputtering process and high density magnetic recording media

2. Physics of high density recording thin film media established by ultra clean sputtering process

3. Structural Changes in Ultra-Thin Ag Films Evaporated on a Cr Seed Layer

4. Grain size reduction by utilizing a very thin CrW seedlayer and dry-etching process in CoCrTaNiPt longitudinal media

5. Novel sputtering process to reduce the grain size and its distribution in Co-based longitudinal thin film media-new seedlayer and high K/sub u//sup Grain/ material

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. 10.4139/sfj.56.558;Journal of The Surface Finishing Society of Japan;2005

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