NARROW TRACK WIDTH SINGLE-POLE HEAD WITH Fe-Si-Al-N THIN FILM-Reference-Cited by-同舟云学术

NARROW TRACK WIDTH SINGLE-POLE HEAD WITH Fe-Si-Al-N THIN FILM

Published:1989 Issue:S_1_PMRC_89 Volume:13 Page:S1_545-549
ISSN:0285-0192
Container-title:Journal of the Magnetics Society of Japan
language:en
Short-container-title:J. Magn. Soc. Jpn.

Author:

HAYASHI Naoto¹,YOSHIMURA Shin-ichi¹,NUMAZAWA Junji¹

Affiliation:

1. NHK Science and Technical Research Labs.

Publisher

The Magnetics Society of Japan

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials

Link

https://www.jstage.jst.go.jp/article/jmsjmag/13/S_1_PMRC_89/13_S_1_PMRC_89_S1_545/_pdf

Reference8 articles.

1. [1] J. Numazawa, Y. Yoneda, F. Aruga and I. Horiuchi : IEICE Technical Report, MR88-14 (1988)

2. [2] Y. Nakamura, K. Yamakawa and S. Iwasaki : IEEE Trans. Magn., MAG-21, 5, 1578 (1985)

3. [3] N. Hayashi, S. Yoshimura and J. Numazawa : Digest of 12th Annual Conference on Magnetics in Japan, 1aD-8 (1988)

4. [4] N. Hayashi, S. Yoshimura and J. Numazawa : Spring National Convention Record of IEICE Japan, SC-2 (1989)

5. [5] C.D. Wagner, Riggs, Lebavis, J.F. Moulder and G.E. Muilenberg : "Handbook of x-ray photoelectron spectroscopy", Perkin Elmer Corp., Physical electronics div. (1979)

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Initial permeability of (111) oriented Fe‐Si polycrystalline thin films;Journal of Applied Physics;1991-10-15

2. A high‐performance permeance meter and its application to measuring the complex permeability of thin Fe‐Si‐Al‐N films for perpendicular magnetic recording heads;Journal of Applied Physics;1991-04-15