Effect of a charged scanned probe microscope tip on a subsurface electron gas-Reference-Cited by-同舟云学术

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Effect of a charged scanned probe microscope tip on a subsurface electron gas

Published:1996-12 Issue:4 Volume:20 Page:435-440
ISSN:0749-6036
Container-title:Superlattices and Microstructures
language:en
Short-container-title:Superlattices and Microstructures

Author:

Eriksson M.A.,Beck R.G.,Topinka M.A.,Katine J.A.,Westervelt R.M.,Campman K.L.,Gossard A.C.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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5. Scanning gate imaging in confined geometries;Physical Review B;2016-02-02

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