Production and Extraction of Highly Charged Ions from the Tokyo EBIT-Reference-Cited by-同舟云学术

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Production and Extraction of Highly Charged Ions from the Tokyo EBIT

Published:2007 Issue: Volume:2 Page:028-028
ISSN:1880-6821
Container-title:Plasma and Fusion Research
language:en
Short-container-title:Plasma and Fusion Research

Author:

FU Yunqing¹,SUN Jian²,SAKURAI Makoto³,NAKAMURA Nobuyuki²,TONA Masahide²⁴,WATANABE Hirofumi²⁴,YAMADA Chikashi²,YOSHIYASU Nobuo²,OHTANI Shunsuke²⁴

Affiliation:

1. The Key Laboratory of Applied Ion Beam Physics, Ministry of Education and Institute of Modern Physics, Fudan University

2. Institute for Laser Science, The University of Electro-Communications

3. Department of Physics, Kobe University

4. CREST, Japan Science and Technology Agency

Publisher

Japan Society of Plasma Science and Nuclear Fusion Research

Subject

Condensed Matter Physics

Link

http://www.jstage.jst.go.jp/article/pfr/2/0/2_0_028/_pdf

Reference6 articles.

1. [1] N. Nakamura and S. Ohtani, AIP Conf. Proc. 771, 209 (2005).

2. S. Ohtani, J. Chin. Chem. Soc. 48, 275 (2001);

3. N. Nakamura et al., Can. J. Phys. in press.

4. Some characteristics in the interaction of slow highly charged Iq+ ions with a Si(111) 1×1-H surface

5. Evolution of ion-charge-state distributions in an electron-beam ion trap

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Characteristics of the Electron Beam Ion Source;Journal of the Vacuum Society of Japan;2012

2. Fluorescence of an organic-dye thin film by interaction with individual slow highly charged ions;Physical Review A;2008-05-27

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