Development of Impurity Profile Diagnostics in the Ergodic Layer of LHD using 3 m Normal Incidence VUV Spectrometer-Reference-Cited by-同舟云学术

Development of Impurity Profile Diagnostics in the Ergodic Layer of LHD using 3 m Normal Incidence VUV Spectrometer

Published:2013 Issue:0 Volume:8 Page:2402093-2402093
ISSN:1880-6821
Container-title:Plasma and Fusion Research
language:en
Short-container-title:Plasma and Fusion Research

Author:

OISHI Tetsutarou¹,MORITA Shigeru¹,DONG Chunfeng¹,WANG Erhui²,GOTO Motoshi¹,

Affiliation:

1. National Institute for Fusion Science

2. Department of Fusion Science, Graduate University for Advanced Studies

Publisher

Japan Society of Plasma Science and Nuclear Fusion Research

Subject

Condensed Matter Physics

Link

https://www.jstage.jst.go.jp/article/pfr/8/0/8_2402093/_pdf

Reference17 articles.

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2. [2] R. Burhenn et al., Nucl. Fusion 49, 065005 (2009).

3. [3] M. Kobayashi et al., Proc. 22nd Int. Conf. on Fusion Energy, Geneva, Switzerland, 13-18 October 2008 (Vienna: IAEA), EX/9-4 “Study on impurity screening in stochastic magnetic boundary of the Large Helical Device” (2008).

4. [4] M.B. Chowdhuri et al., Phys. Plasmas 16, 062502 (2009).

5. [5] S. Morita et al., Plasma Phys. Control. Fusion 48, A269 (2006).

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