VUV Emission Spectroscopy for Evaluation of Optical Thickness in He Cascade Arc Plasmas-Reference-Cited by-同舟云学术

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VUV Emission Spectroscopy for Evaluation of Optical Thickness in He Cascade Arc Plasmas

Published:2021-02-19 Issue:0 Volume:16 Page:2406011-2406011
ISSN:1880-6821
Container-title:Plasma and Fusion Research
language:en
Short-container-title:Plasma and Fusion Research

Author:

ISLAM Md. Anwarul¹,SHIGESADA Ryo¹,YAMAGUCHI Takumi¹,KAWAZOME Hayato²,TAMURA Naoki³,OKUNO Hiroki⁴,NAMBA Shinichi¹

Affiliation:

1. Graduate School of Advanced Science and Engineering, Hiroshima University

2. National Institute of Technology, Kagawa College

3. National Institute for Fusion Science

4. RIKEN, Nishina Center for Accelerator-Based Science

Publisher

Japan Society of Plasma Science and Nuclear Fusion Research

Subject

Condensed Matter Physics

Link

https://www.jstage.jst.go.jp/article/pfr/16/0/16_2406011/_pdf

Reference9 articles.

1. [1] S. Namba, T. Endo, S. Fujino, C. Suzuki and N. Tamura, Rev. Sci. Instrum. 87, 083503 (2016).

2. [2] S. Namba et al., Phys. Plasmas 25, 113511 (2018).

3. [3] A. Hershcovitch, J. Appl. Phys. 78, 5283 (1995).

4. [4] H. Imao et al., Phys. Rev. Accel. Beams 15, 123501 (2012).

5. [6] Md. Anwarul Islam, T. Yamaguchi, K. Fukuyama, H. Kawazome, N. Tamura and S. Namba, IEEE Trans. Plasma Sci. Special Issue (2020).

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1. Evaluation of self-absorption effect of He I resonance line by measurement of forbidden emission in helium arc jet plasma;Physics of Plasmas;2022-11

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