X-Ray Diffraction Line Profile Analysis of Strongly Textured Thin Films of ZnO
Author:
Publisher
University of Zilina
Subject
Transportation,Electrical and Electronic Engineering,Mechanical Engineering
Link
http://komunikacie.uniza.sk/doi/10.26552/com.C.2003.2.37-40.pdf
Reference11 articles.
1. X-ray diffraction studies of thin films and multilayer structures
2. Applicabilities of the Warren–Averbach analysis and an alternative analysis for separation of size and strain broadening
3. A rapid method for analysing the breadths of diffraction and spectral lines using the Voigt function
4. Determination of crystallite size and lattice distortions through X-ray diffraction line profile analysis
5. Voigt-function modeling in Fourier analysis of size- and strain-broadened X-ray diffraction peaks
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