Abstract
In this Part 3 survey article of atomic spectroscopy instrument components, we look at instrument components and subassemblies used for the special components and terms used in atomic spectroscopy instrumentation for inductively coupled plasma–mass spectrometry (ICP-MS), ICP–optical emission spectrometry (ICP-OES), X-ray fluorescence (XRF), energy-dispersive X-ray spectroscopy (EDX), total reflection X-ray fluorescence (TXRF), and laser-induced breakdown spectroscopy (LIBS). Our “under the hood” look continues as we survey the most typical atomic spectroscopy design components. As we continue publishing our four-part component survey series, we note that tutorial articles, and The Spectroscopy Instrument Components Terminology Guide, posted digitally in February 2022, are available to our readers.
Publisher
Multimedia Pharma Sciences, LLC
Subject
Spectroscopy,Atomic and Molecular Physics, and Optics,Analytical Chemistry
Reference4 articles.
1. J. Workman, The Spectroscopy Instrument Components Terminology Guide 2022 37(s2), 1–25 (2022).
2. H.J. Kunze, Introduction to Plasma Spectroscopy (Springer Science & Business Media, Berlin, Germany, 2000), vol. 56.
3. J.M. Hollas, Basic Atomic and Molecular Spectroscopy (Royal Society of Chemistry, Burlington House, United Kingdom, 2002), vol. 11.
4. J.A. Holcombe, G.M. Hieftje, and V. Majidi (eds), Focus on Analytical Spectrometry: A Compendium of Applied Spectroscopy Focal Point Articles (1994-1997) (Society for Applied Spectroscopy, Frederick, Maryland, 1998).
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