Defect Analysis of Gd2O2S : Tb Using Coincidence Doppler Broadening Positron Annihilation Spectroscopy-Reference-Cited by-同舟云学术

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Defect Analysis of Gd2O2S : Tb Using Coincidence Doppler Broadening Positron Annihilation Spectroscopy

Published:2006-07-27 Issue:7 Volume:16 Page:455-459
ISSN:1225-0562
Container-title:Korean Journal of Materials Research
language:en
Short-container-title:Korean Journal of Materials Research

Author:

Lee C.Y.,Bae S.H.,Kim J.H.,Kwon J.H.

Publisher

The Materials Research Society of Korea

Subject

General Materials Science

Link

http://ocean.kisti.re.kr/downfile/crosscheck/mrsk/JAKO200606141038780.pdf

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The Defect Characterization of Luminescence Thin Film by the Positron Annihilation Spectroscopy;Journal of the Korean Vacuum Society;2013-09-30

2. A Study on the Defect Analysis of Image Plate by Accumulated Radiation Dose;Communications in Computer and Information Science;2012

3. The Characterization of Proton Irradiated BaSrFBr:Eu Film by the Coincidence Doppler Broadening Positron Annihilation Spectroscopy;Journal of the Korean Vacuum Society;2009-11-30

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