Defect Analysis of Gd2O2S : Tb Using Coincidence Doppler Broadening Positron Annihilation Spectroscopy
Author:
Publisher
The Materials Research Society of Korea
Subject
General Materials Science
Link
http://ocean.kisti.re.kr/downfile/crosscheck/mrsk/JAKO200606141038780.pdf
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. The Defect Characterization of Luminescence Thin Film by the Positron Annihilation Spectroscopy;Journal of the Korean Vacuum Society;2013-09-30
2. A Study on the Defect Analysis of Image Plate by Accumulated Radiation Dose;Communications in Computer and Information Science;2012
3. The Characterization of Proton Irradiated BaSrFBr:Eu Film by the Coincidence Doppler Broadening Positron Annihilation Spectroscopy;Journal of the Korean Vacuum Society;2009-11-30
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