Influence of Copper Concentration on the Structural and Optical Properties of Chemically Deposited CuSbS2 Thin Films
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Published:2016-01-25
Issue:1
Volume:19
Page:015-019
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ISSN:2292-1168
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Container-title:Journal of New Materials for Electrochemical Systems
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language:
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Short-container-title:J. New Mat. Electrochem. Sys.
Author:
Vijila Jebadurai Joy Jeba,Mohanraj Kannusamy,Thanikaikarasan Sethuramachandran,Sivakumar Ganesan,Mahalingam Thaiyan,Ixtlilco Luis
Abstract
Thin films of CuSbS2 have been deposited on ultrasonically cleaned glass substrates using a simple chemical bath deposition technique. Prepared films have been characterized using X-ray diffraction, Field Emission Scanning Electron Microscopy and UV-Vis-NIR spectroscopic techniques, respectively. X-ray diffraction analysis revealed that the prepared films possess polycrystalline in nature with orthorhombic CuSbS2 in addition to secondary phase of monoclinic Cu3SbS3 and cubic Cu12Sb4S13 for different copper concentrations. Field Emission Scanning Electron Spectroscopic analysis showed that the prepared films possess spherical shaped grains with irregular shaped clusters. Optical absorption analysis showed that the prepared films possess band gap value in the range between 1.7 and 2.4 eV.
Publisher
Journal of New Materials for Electrochemical Systems
Subject
Electrochemistry,General Materials Science,Renewable Energy, Sustainability and the Environment
Cited by
2 articles.
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