Determination of light elements C, N, O in various minerals and synthetic compounds using X-ray microanalysis-Reference-Cited by-同舟云学术

Determination of light elements C, N, O in various minerals and synthetic compounds using X-ray microanalysis

Published:2019-03-29 Issue:3 Volume:85 Page:5-13
ISSN:2588-0187
Container-title:Industrial laboratory. Diagnostics of materials
language:
Short-container-title:Zavod. lab., Diagn. mater.

Author:

Kulikova I. M.¹,Nabelkin O. A.¹

Affiliation:

1. Institute of Mineralogy, Geochemistry and Crystallochemistry of Rare Elements (FGBUIMGRE)

Publisher

TEST-ZL Publishing

Subject

Condensed Matter Physics

Reference16 articles.

1. Bastin G. F., Heijligers H. J. M. Quantitative Electron Probe Microanalysis of Carbon in binary Carbides. Parts I and II / X-Ray Spectrom. 1986. Vol. 15. N 2. P. 135 - 150.

2. Bastin G. F, Heijligers H. J. M. Quantitative Electron Probe Microanalysis of Ultra Light Elements / J. Microsc. Spectr. Electron. 1986. Vol. 11. P. 215 - 228.

3. Bastin G. F., Heijligers H. J. M. Quantitative Electron Probe Microanalysis of Oxygen. — Eindhoven, Netherlands: University of Technology, 1989. — 165 p.

4. Bastin G. F., Heijligers H. J. M. Quantitative Electron Probe Microanalysis of Boron / J. Solid State Chem. 2000. Vol. 154. P. 177 - 187.

5. Rigby M., Droop G., Plant D., Graser P. Electron probe micro-analysis of oxygen in cordierite: potential implications for the analysis of volatiles in minerals /South African J. Geol. 2008. Vol. 111. P 239 - 250.

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