Author:
Xie Weilin 谢玮霖,Dong Yi 董毅,Zhou Qian 周潜,Chang Le 常乐,He Hao 何浩,Hu Weisheng 胡卫生
Publisher
Shanghai Institute of Optics and Fine Mechanics
Subject
Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
1 articles.
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1. Statistics for Intensity of Rayleigh Backscattering Based Coherent Distributed Measurement System;2023 Asia Communications and Photonics Conference/2023 International Photonics and Optoelectronics Meetings (ACP/POEM);2023-11-04