Imaging photothermal microscopy for absorption measurements of optical coatings-Reference-Cited by-同舟云学术

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Imaging photothermal microscopy for absorption measurements of optical coatings

Published:2009 Issue:11 Volume:7 Page:1061-1064
ISSN:1671-7694
Container-title:Chinese Optics Letters
language:en
Short-container-title:中国光学快报

Author:

Chunxian Tao 陶春先,Yuanan Zhao 赵元安,Hongbo He 贺洪波,Dawei Li 李大伟,Jianda Shao 邵建达,Zhengxiu Fan 范正修

Publisher

Shanghai Institute of Optics and Fine Mechanics

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Fast measurement technique for obtaining the low damage threshold defects in a large aperture fused silica glass;Pacific Rim Laser Damage 2019: Optical Materials for High-Power Lasers;2019-07-08

3. Photothermal Laser Material Interactions - From the Sledgehammer to Nano-GPS;Advances in Intelligent and Soft Computing;2012

4. Automated damage diagnostic system for laser damage threshold tests;Chinese Optics Letters;2010

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