Depth Test of Pipeline Defects by Active Thermal Excitation and Infrared Thermography-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Depth Test of Pipeline Defects by Active Thermal Excitation and Infrared Thermography

Published:2018 Issue:9 Volume:38 Page:0912003
ISSN:0253-2239
Container-title:Acta Optica Sinica
language:en
Short-container-title:光学学报

Author:

Wang Zhuo 王卓,Zhang Yunwei 张云伟,Yu Yong 喻勇,Fan Yangyang 樊阳阳

Publisher

Shanghai Institute of Optics and Fine Mechanics

Subject

Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. 基于主动红外激励的硅通孔内部多缺陷分类与定位;Laser & Optoelectronics Progress;2024

2. Experimental investigation for multi-defect detection of industrial pipeline based on passive infrared thermal imaging analysis: A case study;International Journal of Pressure Vessels and Piping;2023-12

3. 基于深度迁移学习的脉冲涡流热成像裂纹缺陷检测;Acta Optica Sinica;2023

4. 基于直方图梯度加权的电润湿显示器缺陷检测;Laser & Optoelectronics Progress;2021

5. Depth Detection of Material Surface Defects Based on Laser Thermography;Laser & Optoelectronics Progress;2021

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP