基于合成缺陷的偏光片外观对抗异常检测方法

Author:

Zhong Xiaopin 钟小品,Zhu Junwei 朱俊玮,Lie Zhihao 列智豪,Deng Yuanlong 邓元龙

Publisher

Shanghai Institute of Optics and Fine Mechanics

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics

Reference28 articles.

1. An effective defect inspection system for polarized film images using image segmentation and template matching techniques;C W Chung;Computers & Industrial Engineering,2008

2. Research and development of intelligent on-line real-time defect inspection system for polymer polarizer;C H Chiu;Polymer-Plastics Technology and Engineering,2009

3. Application of the Haar wavelet to Mura detection for polarizer;C C Cheng,2013

4. Classification of defects in the polarizer of display panels using the convolution neural network (CNN);H Joo;International Journal of Computing, Communication and Instrumentation Engineering,2017

5. Defect detection for polymeric polarizer based on faster R-CNN;H W Lei;Journal of Information Hiding and Multimedia Signal Processing,2018

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