Strip Defect Classification Based on Improved Generative Adversarial Networks and MobileNetV3-Reference-Cited by-同舟云学术

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Strip Defect Classification Based on Improved Generative Adversarial Networks and MobileNetV3

Published:2021 Issue:4 Volume:58 Page:0410016
ISSN:1006-4125
Container-title:Laser & Optoelectronics Progress
language:en
Short-container-title:激光与光电子学进展

Author:

Chang Jiang 常江,Guan Shengqi 管声启,Shi Hongyu 师红宇,Hu Luping 胡璐萍,Ni Yiqi 倪奕棋

Publisher

Shanghai Institute of Optics and Fine Mechanics

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Mobile-YOLO: An accurate and efficient three-stage cascaded network for online fiberglass fabric defect detection;Engineering Applications of Artificial Intelligence;2024-08

2. A High-Quality Sample Generation Method for Improving Steel Surface Defect Inspection;Sensors;2024-04-20

3. Research on micro defect recognition based on deep learning;International Journal of Bio-Inspired Computation;2024

4. An Overview of Image Generation of Industrial Surface Defects;Sensors;2023-09-28

5. Defects Recognition of Train Wheelset Tread Based on Improved Spiking Neural Network;Chinese Journal of Electronics;2023-09

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