Testing system for radiation effects of CCD and CMOS image sensors-Reference-Cited by-同舟云学术

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Testing system for radiation effects of CCD and CMOS image sensors

Published:2013 Issue:11 Volume:21 Page:2778-2784
ISSN:1004-924X
Container-title:Optics and Precision Engineering
language:en
Short-container-title:光学精密工程

Author:

LI Yu-dong 李豫东,WANG Bo 汪波,GUO Qi 郭旗,MA Li-ya 玛丽娅,REN Jian-wei 任建伟

Publisher

Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences

Subject

Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Analysis of SNR in 4-transistor backside-illuminated CMOS image sensor;Fifth Symposium on Novel Optoelectronic Detection Technology and Application;2019-03-12

3. Thermal Design of Large-Power Focal Plane Components for a Microsatellite Based on Pyrolytic Graphite Sheet;International Journal of Aerospace Engineering;2019-02-25

4. Test Method of Optoelectronic Parameters of CMOS Camera;Laser & Optoelectronics Progress;2018

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