Experimental study on heavy-ion single event effect on nanometer DDR SRAM-Reference-Cited by-同舟云学术

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Experimental study on heavy-ion single event effect on nanometer DDR SRAM

Published:2013 Issue:10 Volume:25 Page:2705-2710
ISSN:1001-4322
Container-title:High Power Laser and Particle Beams
language:en
Short-container-title:强激光与粒子束

Author:

Luo Yinhong 罗尹虹,Zhang Fengqi 张凤祁,Guo Hongxia 郭红霞,Zhou Hui 周辉,Wang Yanping 王燕萍,Zhang Keying 张科营

Publisher

Shanghai Institute of Optics and Fine Mechanics

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Proof and Modification of the Burst Generation Rate Model;IEEE Electron Device Letters;2023-12

2. A new model for predicting proton SEE cross sections based on heavy ion data;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2022-09

3. Study on Three-Dimensional Analysis Method of Radiation Dose of GEO Satellite;MATEC Web of Conferences;2019

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