基于矢量光束偏振特性的薄膜参数表征
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Publisher
Shanghai Institute of Optics and Fine Mechanics
Reference24 articles.
1. Ultra-high resolution imaging of thin films and single strands of polythiophene using atomic force microscopy;A Murphy;Nature Communications,2019
2. Anomalous 3D nanoscale photoconduction in hybrid perovskite semiconductors revealed by tomographic atomic force microscopy;N P Padture;Nature Communications,2020
3. Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers;I Ohlídal;Optics Express,2020
4. Polarized angle-resolved spectral reflectometry for real-time ultra-thin film measurement;L H Peng;Optics Express,2023
5. Photonic-dispersion neural networks for inverse scattering problems;A Chen;Light: Science & Applications,2021
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