Author:
Zhao Hui 赵晖,Wu Tengfei 吴腾飞,Zhou Qiang 周强,Duan Zhijun 段志君
Publisher
Shanghai Institute of Optics and Fine Mechanics
Subject
Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference44 articles.
1. Advances in large-scale metrology-review and future trends;E Morse;CIRP Annals,2016
2. Model-based interfacing of large-scale metrology instruments;B Montavon;Proceedings of SPIE,2019
3. Frequency scanning interferometry absolute distance measurement;Q Zhou;Chinese Journal of Lasers,2021
4. 光频扫描干涉绝对距离测量;吴腾飞;中国激光,2021
5. Dynamic cascade-model-based frequency-scanning interferometry for real-time and rapid absolute optical ranging;Z W Deng;Optics Express,2019