Degradation behavior and degradation mechanism of bridged-grain polycrystalline silicon thin film transistors under AC gate bias stress
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Published:2017
Issue:2
Volume:32
Page:91-96
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ISSN:1007-2780
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Container-title:Chinese Journal of Liquid Crystals and Displays
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language:en
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Short-container-title:液晶与显示
Author:
ZHANG Meng 张猛,XIA Zhi-he 夏之荷,ZHOU Wei 周玮,CHEN Rong-sheng 陈荣盛,WONG Man 王文,KWOK Hoi-Sing 郭海成
Publisher
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences
Subject
Instrumentation,Signal Processing,Electronic, Optical and Magnetic Materials