A PRACTICAL ELECTRO-OPTIC SAMPLER FOR CHARACTERIZATION INTERNAL TO GaAs ICs-Reference-Cited by-同舟云学术

A PRACTICAL ELECTRO-OPTIC SAMPLER FOR CHARACTERIZATION INTERNAL TO GaAs ICs

Published:1996-09 Issue:03 Volume:07 Page:463-469
ISSN:0129-1564
Container-title:International Journal of High Speed Electronics and Systems
language:en
Short-container-title:Int. J. Hi. Spe. Ele. Syst.

Author:

YI MAOBIN¹,SUN WEI¹,TIAN XIAOJIAN¹,JIA GANG¹,LIU SHIYONG¹

Affiliation:

1. State Key Laboratory on Integrated Optoelectronics, Department of Electronic Engineering, Jilin University, Changchun 130023, China

Abstract

This paper describes a practical electro-optic sampler of the measuring-microscope mode for noninvasive measurements of voltage waveforms at points internal to a GaAs integrated circuit. A 360° linear sweep phase shifter is used to provide the scanning delay of the sampling point in time, and was typically demonstrated in measuring the dynamic frequency divider circuit. In addition to the characterization internal to GaAs ICs, the overlap of the electrical signal field in an integrated circuit and the interference effect on the signal voltage calibration are also investigated.

Publisher

World Scientific Pub Co Pte Lt

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Electronic, Optical and Magnetic Materials

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0129156496000268

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