EFFECT OF GRAIN SIZE ON THE ELECTRON WORK FUNCTION OF Cu AND Al
Author:
Affiliation:
1. Changchun University, P. R. China
2. Department of Chemical and Materials Engineering, University of Alberta, Edmonton, Alberta, Canada T6G 2G6, Canada
Abstract
Publisher
World Scientific Pub Co Pte Lt
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Link
https://www.worldscientific.com/doi/pdf/10.1142/S0218625X04006025
Reference20 articles.
1. In situ high-resolution electron microscopy observation of grain-boundary migration through ledge motion in an Al-Mg alloy
2. High resolution transmission electron microscopy of Ba1−xKxBiO3 superconductor-insulator-superconductor grain boundary tunnel junctions
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