SUPERSTRUCTURE FORMATION AND X-RAY PHOTOEMISSION PROPERTIES OF THE TlTiOPO4 SURFACE

Author:

ATUCHIN V. V.1,POKROVSKY L. D.1,KESLER V. G.2,YU. MAKLAKOVA N.3,VORONKOVA V. I.4,YANOVSKII V. K.4

Affiliation:

1. Laboratory of Optical Materials and Structures, Institute of Semiconductor Physics, Novosibirsk, 630090, Russia

2. Technical Centre, Institute of Semiconductor Physics, Novosibirsk, 630090, Russia

3. Laboratory of Crystal Growth, Institute of Mineralogy and Petrography, Novosibirsk, 630090, Russia

4. Department of Physics, Moscow State University, Moscow, 117234, Russia

Abstract

X-ray photoemission spectroscopy (XPS) measurements have been executed for TlTiOPO 4 to elucidate the general features in the electronic structure of the KTiOPO 4 family compounds. The peculiarities of the valence band structure have been discussed for the crystals. The persistence of core level binding energy differences O 1s–P 2p and O 1s–Ti 2p 3/2 has been detected in TlTiOPO 4 and KTiOPO 4, which relates well with the constancy of averaged P – O and Ti – O chemical bond lengths in this crystal family. The superstructure ordering of the TlTiOPO 4 surface subjected to polishing and annealing has been detected by reflectance high energy electron diffraction (RHEED). From comparison of surface crystallographic properties of TlTiOPO 4 and KTiOPO 4, the most typical superstructure indices have been revealed.

Publisher

World Scientific Pub Co Pte Lt

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

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