LATEST PHOTOEMISSION DEVELOPMENTS: TIME RESOLUTION, MICROANALYSIS, ORDER PARAMETERS-Reference-Cited by-同舟云学术

LATEST PHOTOEMISSION DEVELOPMENTS: TIME RESOLUTION, MICROANALYSIS, ORDER PARAMETERS

Published:1997-08 Issue:04 Volume:04 Page:695-701
ISSN:0218-625X
Container-title:Surface Review and Letters
language:en
Short-container-title:Surf. Rev. Lett.

Author:

COMELLI G.¹²,KISKINOVA M.¹,PAOLUCCI G.¹²,PRINCE K. C.¹,SAVOIA A.¹,MARGARITONDO G.³²

Affiliation:

1. Sincrotrone Trieste SCpA, Trieste, Italy

2. Dipartimento di Fisica, Università di Trieste, Via A, Valerio 2, I-34127, Trieste, Italy

3. Institut de Physique Appliquée, Ecole Polytechnique Fédérale, CH-1015 Lausanne, Switzerland

Abstract

The third generation sources of soft X-rays, ALS and ELETTRA, have been producing data in surface and interface science for over two years. The impact of their ultrahigh brightness is quite evident, particularly as far as photoemission techniques are concerned. We illustrate this point with a short review of very recent examples from ELETTRA, in the specific domains of time resolution, high lateral resolution and high energy resolution.

Publisher

World Scientific Pub Co Pte Lt

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0218625X97000699

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