EFFECTS OF ELECTRODE RESISTANCE ON THE DIELECTRIC BEHAVIORS OF Au/BaxSr1−xTiO3/La1.1Sr0.9NiO4 CAPACITORS

Abstract

BaxSr[Formula: see text]TiO3 ([Formula: see text]) (BST) thin films were prepared on La[Formula: see text]Sr[Formula: see text]NiO4 (LSNO)/SrTiO3 (STO) structure by combinatorial pulsed laser deposition (comb-PLD). The capacitances of the Au/BST/LSNO capacitors exhibited strong frequency dependence especially when the applied frequency was higher than 10[Formula: see text]kHz. On the basis of an equivalent circuit model, we presented a theoretical simulation of the relationships between capacitance and frequency for the capacitors with different electrode serial resistances. Based on the fitting results, the observed strong frequency dependence of the measured capacitance at high frequency in our study could be ascribed to the large serial resistance of 750 [Formula: see text] for oxide electrode LSNO. Further simulation studies found that large serial resistance (1000 [Formula: see text]) could result in an apparent deviation from the intrinsic dielectric properties especially at high frequencies ([Formula: see text]100[Formula: see text]kHz) for capacitors with capacitances above 1[Formula: see text]nF. Our results provide useful information for the design of all-oxide electronic devices.