Affiliation:
1. Istituto di Struttura della Materia del CNR, Via del Fosso del Cavaliere 130, Rome, Italy
Abstract
A brief description of the scanning probe microscopies is given, with particular attention to atomic force microscopy (AFM) and near field optical microscopy (SNOM). We show examples of AFM used in friction mode and in topographic mode. The basic principles of SNOM are also presented, together with images obtained on artificial diamond films and on neuron networks.
Publisher
World Scientific Pub Co Pte Lt
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Cited by
4 articles.
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