Projected Measures: A Simple Way to Characterize Fractal Structures and Interfaces

Abstract

The properties of projected measures of fractal objects are investigated in detail. In general, projected measures display multifractal features which play a role in the evolution of dynamic phenomena on/through fractal structures. Closed-form results are obtained for the moment hierarchy of model fractal interfaces. The distinction between self-similar and self-affine interfaces is discussed by considering the properties of multifractal spectra, the orientational effects in the behavior of the moment hierarchies, and the scaling of the corresponding Fourier transforms. The implications of the properties of projected measures in the characterization of transfer phenomena across fractal interfaces are briefly analyzed.